Tato práce se zabývá možnostmi využití konfokální mikroskopie k rozpoznání rysů nepůvodních systémů na čipu (SoC) integrovaného obvodu a je jednou z prvních v oblasti aplikace konfokální mikroskopie. Práce sestává ze dvou částí, části teoretické a části experimentální.
Annotation in English
This thesis on using confocal microscopy to detect counterfeit electronic components is one of the first of its kind. It consists of two parts: theoretical background and practical experimentation.
Keywords
systém na čipu (SoC), konfokální mikroskop s laserovým skenováním (LSCM), původní a nepůvodní elektronická součástka
Tato práce se zabývá možnostmi využití konfokální mikroskopie k rozpoznání rysů nepůvodních systémů na čipu (SoC) integrovaného obvodu a je jednou z prvních v oblasti aplikace konfokální mikroskopie. Práce sestává ze dvou částí, části teoretické a části experimentální.
Annotation in English
This thesis on using confocal microscopy to detect counterfeit electronic components is one of the first of its kind. It consists of two parts: theoretical background and practical experimentation.
Keywords
systém na čipu (SoC), konfokální mikroskop s laserovým skenováním (LSCM), původní a nepůvodní elektronická součástka
1.Fundamental study of counterfeit components problematics. 2.Fundamental study of semiconductor component design and technology. 3.Study of confocal microscopy principles and methodology. 4.Analyse decapsulated semiconductor chips surface with confocal microscope, study and recommend observable features suitable for authenticity evaluation. 5.Design a method for an efficient confocal microscopy outputs evaluation aimed at differences between genuine and counterfeit chips. 6.Create the studied chips confocal microscopy instructive set for differences demonstration
Research Plan
1.Fundamental study of counterfeit components problematics. 2.Fundamental study of semiconductor component design and technology. 3.Study of confocal microscopy principles and methodology. 4.Analyse decapsulated semiconductor chips surface with confocal microscope, study and recommend observable features suitable for authenticity evaluation. 5.Design a method for an efficient confocal microscopy outputs evaluation aimed at differences between genuine and counterfeit chips. 6.Create the studied chips confocal microscopy instructive set for differences demonstration
Recommended resources
[1] Tehranipoor, Mark (mohammad), Guin, U., & Forte, D. (2016). Counterfeit integrated circuits: Detection and avoidance. Cham, Switzerland: Springer International Publishing. [2] Tehranipoor, Mohammad, Salmani, H., & Zhang, X. (2013). Integrated circuit authentication: Hardware Trojans and counterfeit detection (2014th ed.). Cham, Switzerland: Springer International Publishing. [3] Nishi, Y., & Doering, R. (Eds.). (2017). Handbook of semiconductor manufacturing technology, second edition. doi:10.1201/9781420017663 [4] Hawkes, P. W., & Spence, J. C. H. (Eds.). (2008). Science of Microscopy (1st ed.). New York, NY: Springer. [5] Paddock, S. W. (Ed.). (2013). Confocal microscopy: Methods and protocols (2nd ed.). doi:10.1007/978-1-60761-847-8 [6] Price, R. L., & Jerome, W. G. (jay) (Eds.). (2016). Basic confocal microscopy. New York, NY: Springer.
Recommended resources
[1] Tehranipoor, Mark (mohammad), Guin, U., & Forte, D. (2016). Counterfeit integrated circuits: Detection and avoidance. Cham, Switzerland: Springer International Publishing. [2] Tehranipoor, Mohammad, Salmani, H., & Zhang, X. (2013). Integrated circuit authentication: Hardware Trojans and counterfeit detection (2014th ed.). Cham, Switzerland: Springer International Publishing. [3] Nishi, Y., & Doering, R. (Eds.). (2017). Handbook of semiconductor manufacturing technology, second edition. doi:10.1201/9781420017663 [4] Hawkes, P. W., & Spence, J. C. H. (Eds.). (2008). Science of Microscopy (1st ed.). New York, NY: Springer. [5] Paddock, S. W. (Ed.). (2013). Confocal microscopy: Methods and protocols (2nd ed.). doi:10.1007/978-1-60761-847-8 [6] Price, R. L., & Jerome, W. G. (jay) (Eds.). (2016). Basic confocal microscopy. New York, NY: Springer.
