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Lecturer(s)
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Mráček Aleš, prof. Mgr. Ph.D.
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Minařík Antonín, doc. Ing. Ph.D.
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Kadlečková Markéta, Ing. Ph.D.
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Kocourková Karolína, Ing. Ph.D.
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Mikulka Filip, Ing.
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Course content
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- Basic properties of imaging in a light microscope (optical scheme, resolution, magnification, depth of field). - Structural parts of a light microscope and their properties. - Imaging methods: classical microscope, stereomicroscope, bright and dark field, phase contrast. - Imaging methods: interference, polarization, ultraviolet, infrared and fluorescence microscopy. Confocal microscope. - Distribution of phenomena during the interaction of electrons with a solid substance. Basic principles of electron optics, electrostatic and magnetic lenses and their aberrations. Construction and principle of operation of a scanning electron microscope. Display parameters (resolution, depth of field and contrast). - Construction and principle of operation of a transmission electron microscope. Display parameters (resolution, depth of field and contrast). - Preparation of samples for electron microscopy (fixation, evaporation, microtome, method, freeze-fracture), analytical electron microscopy. - Probe scanning microscopy, basic principles of these methods, possibilities of use, advantages and disadvantages. - STM (scanning tunneling microscopy), AFM (atomic force microscopy). - MFM (Magnetic Force Microscopy), SNOM (Near Field Microscopy), etc. Layout and technical description of these microscopes, detectors, probes, motion elements, possible working environment, resolution capabilities, etc. Interpretation of results, measurement errors and artifacts, image processing. Practical applications and use of selected SPM techniques in characterizing the surface and structure of materials.
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Learning activities and teaching methods
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Lecturing, Simple experiments
- Preparation for examination
- 90 hours per semester
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| prerequisite |
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| Knowledge |
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| Knowledge of physics. |
| Knowledge of physics. |
| learning outcomes |
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| describe the parts of an optical microscope and their function |
| describe the parts of an optical microscope and their function |
| justify the use of imaging methods (interference, polarisation, ultraviolet, infrared and fluorescence microscopy) |
| justify the use of imaging methods (interference, polarisation, ultraviolet, infrared and fluorescence microscopy) |
| describe the design and principle of operation of a scanning electron microscope |
| describe the design and principle of operation of a scanning electron microscope |
| describe the design and principle of operation of a transmission electron microscope |
| describe the design and principle of operation of a transmission electron microscope |
| describe the design and working principle of scanning probe microscopy |
| describe the design and working principle of scanning probe microscopy |
| Skills |
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| select the appropriate method for a particular sample |
| select the appropriate method for a particular sample |
| propose the use of an optical microscope |
| propose the use of an optical microscope |
| propose the use of a scanning electron microscope |
| propose the use of a scanning electron microscope |
| propose the use of a transmission electron microscope |
| propose the use of a transmission electron microscope |
| propose the use of scanning probe microscopy |
| propose the use of scanning probe microscopy |
| teaching methods |
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| Knowledge |
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| Lecturing |
| Lecturing |
| Dialogic (Discussion, conversation, brainstorming) |
| Dialogic (Discussion, conversation, brainstorming) |
| Skills |
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| Simple experiments |
| Simple experiments |
| Practice exercises |
| Practice exercises |
| assessment methods |
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| Knowledge |
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| Didactic test |
| Didactic test |
| Oral examination |
| Oral examination |
| Grade (Using a grade system) |
| Grade (Using a grade system) |
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Recommended literature
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HAWKES P.V., SPENCE, J.C.H. Science of Microscopy. New York: Spriger, 2007. ISBN 978-0-387-25296-4.
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Kubínek, Roman. Mikroskopie skenující sondou. 1. vyd. V Olomouci : Vydavatelství Univerzity Palackého, 2003. ISBN 80-244-0602-0.
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Murphy, Douglas B. Fundamentals of light microscopy and electronic imaging. New York : Wiley-Liss, 2001. ISBN 0-471-25391-X.
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Williams, David Bernard. Transmission electron microscopy : a textbook for materials science. 2nd ed. New York : Springer, 2009. ISBN 978-0-387-76500-6.
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