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Lecturer(s)
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Mráček Aleš, prof. Mgr. Ph.D.
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Kadlečková Markéta, Ing. Ph.D.
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Kocourková Karolína, Ing. Ph.D.
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Minařík Antonín, doc. Ing. Ph.D.
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Mikulka Filip, Ing.
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Course content
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1. Basic properties of imaging in a light microscope (optical scheme, resolution, magnification, depth of field). 2. Light microscope components and their properties. 3. Imaging methods: classical microscope, stereomicroscope, light and dark field, phase contrast. 4. Imaging methods: interference, polarization, ultraviolet, infrared and fluorescence microscopy. Confocal microscope. 5. Distribution of phenomena in the interaction of electrons with a solid. Basic principles of electron optics, electrostatic and magnetic lenses and their aberrations. Construction and principle of operation of a scanning electron microscope. Display parameters (resolution, depth of field and contrast). 6. Construction and principle of transmission electron microscope operation. Display parameters (resolution, depth of field and contrast). 7. Preparation of samples for electron microscopy (fixation, evaporation, microtome, method, freeze-fracture), analytical electron microscopy. 8. Scanning probe microscopy, basic principles of these methods, possibilities of use, advantages and disadvantages. 9. STM (scanning tunneling microscopy), AFM (atomic force microscopy).
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Learning activities and teaching methods
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Lecturing, Simple experiments
- Participation in classes
- 42 hours per semester
- Preparation for examination
- 18 hours per semester
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| prerequisite |
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| Knowledge |
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| Knowledge of physics. |
| Knowledge of physics. |
| learning outcomes |
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| describe the parts of an optical microscope and their function |
| describe the parts of an optical microscope and their function |
| justify the use of imaging methods (interference, polarisation, ultraviolet, infrared and fluorescence microscopy) |
| justify the use of imaging methods (interference, polarisation, ultraviolet, infrared and fluorescence microscopy) |
| describe the design and principle of operation of a scanning electron microscope |
| describe the design and principle of operation of a scanning electron microscope |
| describe the design and principle of operation of a transmission electron microscope |
| describe the design and principle of operation of a transmission electron microscope |
| describe the design and working principle of scanning probe microscopy |
| describe the design and working principle of scanning probe microscopy |
| Skills |
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| select the appropriate method for a particular sample |
| select the appropriate method for a particular sample |
| propose the use of an optical microscope |
| propose the use of an optical microscope |
| propose the use of a scanning electron microscope |
| propose the use of a scanning electron microscope |
| propose the use of a transmission electron microscope |
| propose the use of a transmission electron microscope |
| propose the use of scanning probe microscopy |
| propose the use of scanning probe microscopy |
| teaching methods |
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| Knowledge |
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| Lecturing |
| Lecturing |
| Dialogic (Discussion, conversation, brainstorming) |
| Dialogic (Discussion, conversation, brainstorming) |
| Skills |
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| Simple experiments |
| Simple experiments |
| Practice exercises |
| Practice exercises |
| assessment methods |
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| Knowledge |
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| Oral examination |
| Grade (Using a grade system) |
| Didactic test |
| Didactic test |
| Grade (Using a grade system) |
| Oral examination |
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Recommended literature
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Dawes C.J. Introduction to Biological Electron Microscopy: Theory and Techniques. Vermont, 1988.
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HAWKES P.V., SPENCE, J.C.H. Science of Microscopy. New York: Spriger, 2007. ISBN 978-0-387-25296-4.
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Kalina T., Pokorný V. Základy elektronové mikroskopie pro biology. Praha, 1981. ISBN skriptum.
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Kubínek, Roman. Mikroskopie skenující sondou. 1. vyd. V Olomouci : Vydavatelství Univerzity Palackého, 2003. ISBN 80-244-0602-0.
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Murphy, Douglas B. Fundamentals of light microscopy and electronic imaging. New York : Wiley-Liss, 2001. ISBN 0-471-25391-X.
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Williams, David Bernard. Transmission electron microscopy : a textbook for materials science. 2nd ed. New York : Springer, 2009. ISBN 978-0-387-76500-6.
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