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Lecturer(s)
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Kadlečková Markéta, Ing. Ph.D.
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Mráček Aleš, prof. Mgr. Ph.D.
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Minařík Antonín, doc. Ing. Ph.D.
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Kocourková Karolína, Ing. Ph.D.
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Course content
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- Basic characterization of light microscopy (optical construction, resolution, magnification, depth of field). - Construction of light microscopy and its characterization. - Imaging methods: classical microscopy, streo-microscopy, dark field microscopy, phase contrast microscopy. - Intereference microscopy, polarizing microscopy, ultraviolet microscopy, infrared microscopy and fluorescence microscopy. - Effects of electron interaction with solid matters. - Basic principles of electron microscopy "optics": electro-static and magnetic lenses and its aberration. - Construction and principle of scannig electron microscope. Parameters of imaging (resolution, depth of field, contrast). - Construction and principle of transmission electron microscope. Parameters of imaging (resolution, depth of field, contrast). - Transmission electron microscope and electron diffraction: applications for this method include the identification of lattice defects in crystals. - The samples preparation for electron microscopy (Chemical fixation, Cryofixation-freezing a specimen, Dehydration-freeze drying, Embedding, biological specimens, Embedding (materials), Sectioning (ultramicrotome), Staining, Freeze-fracture or freeze-etch, Ion Beam Milling, Conductive Coating). - Scanning probe microscopy (SPM), basic priciples of these methods, advantages and disadvantages. - Scannig tunnelig microscopy (STM), atomic force microscopy (AFM). - Microscopy of magnetic force (MFM), near-field scanning optical microscopy (SNOM), etc. Construction and technical prameters of these methods, detectors, probes, moving elements, resolution, etc. Results interpretation, artefacts of measuring, image analysis. - SPM applications and utilization of these methods for characterizations of materials surface and structures.
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Learning activities and teaching methods
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Lecturing, Simple experiments
- Preparation for examination
- 60 hours per semester
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| prerequisite |
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| Knowledge |
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| Knowledge of physics. |
| Knowledge of physics. |
| learning outcomes |
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| describe the parts of an optical microscope and their function |
| describe the parts of an optical microscope and their function |
| justify the use of imaging methods (interference, polarisation, ultraviolet, infrared and fluorescence microscopy) |
| justify the use of imaging methods (interference, polarisation, ultraviolet, infrared and fluorescence microscopy) |
| describe the design and principle of operation of a scanning electron microscope |
| describe the design and principle of operation of a scanning electron microscope |
| describe the design and principle of operation of a transmission electron microscope |
| describe the design and principle of operation of a transmission electron microscope |
| describe the design and working principle of scanning probe microscopy |
| describe the design and working principle of scanning probe microscopy |
| Skills |
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| select the appropriate method for a particular sample |
| select the appropriate method for a particular sample |
| propose the use of an optical microscope |
| propose the use of an optical microscope |
| propose the use of a scanning electron microscope |
| propose the use of a scanning electron microscope |
| propose the use of a transmission electron microscope |
| propose the use of a transmission electron microscope |
| propose the use of scanning probe microscopy |
| propose the use of scanning probe microscopy |
| teaching methods |
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| Knowledge |
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| Lecturing |
| Lecturing |
| Dialogic (Discussion, conversation, brainstorming) |
| Dialogic (Discussion, conversation, brainstorming) |
| Skills |
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| Simple experiments |
| Simple experiments |
| Practice exercises |
| Practice exercises |
| assessment methods |
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| Knowledge |
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| Grade (Using a grade system) |
| Didactic test |
| Didactic test |
| Oral examination |
| Grade (Using a grade system) |
| Oral examination |
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Recommended literature
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Dawes C.J. Introduction to Biological Electron Microscopy: Theory and Techniques. Vermont, 1988.
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Kalina T., Pokorný V. Základy elektronové mikroskopie pro biology. Praha, 1981. ISBN skriptum.
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Kubínek, Roman. Mikroskopie skenující sondou. 1. vyd. V Olomouci : Vydavatelství Univerzity Palackého, 2003. ISBN 80-244-0602-0.
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Murphy, Douglas B. Fundamentals of light microscopy and electronic imaging. New York : Wiley-Liss, 2001. ISBN 0-471-25391-X.
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Williams, David Bernard. Transmission electron microscopy : a textbook for materials science. 2nd ed. New York : Springer, 2009. ISBN 978-0-387-76500-6.
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